Typ

Konferenz-Proceedings

Gebiet

Detektorentwicklung

Autor

W.J.C. Koppert, N. van Bakel, Y. Bilevych, P. Colas, K. Desch, M. Fransen, H. van der Graaf, F. Hartjes, N.P. Hessey, J. Kaminski, J. Schmitz, R. Schön, F. Zappon

Titel

VCI 2013 Proceedings: GridPix detectors: Production and beam test results

Datum

2013-12

Reportnummer

NIMA 732 (2013) 245-249

Kurzfassung

The innovative GridPix detector is a Time Projection Chamber (TPC) that is read out with a Timepix-1 pixel chip. By using wafer post-processing techniques an aluminium grid is placed on top of the chip. When operated, the electric field between the grid and the chip is sufficient to create electron induced avalanches which are detected by the pixels. The time-to-digital converter (TDC) records the drift time enabling the reconstruction of high precision 3D track segments. Recently GridPixes were produced on full wafer scale, to meet the demand for more reliable and cheaper devices in large quantities. In a recent beam test the contribution of both diffusion and time walk to the spatial and angular resolutions of a GridPix detector with a 1.2 mm drift gap are studied in detail. In addition long term tests show that in a significant fraction of the chips the protection layer successfully quenches discharges, preventing harm to the chip.

Journal

doi:10.1016/j.nima.2013.08.010